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au.\*:("PICKAR KA")

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ION IMPLANTATION IN SILICON-PHYSICS, PROCESSING, AND MICROELECTRONIC DEVICES.PICKAR KA.1975; APPL. SOLID STATE SCI.; U.S.A.; DA. 1975; VOL. 5; PP. 151-249; BIBL. 7 P. 1/2Article

ELECTRON IRRADIATION OF MIS CAPACITORS-ANNEALING AND BIAS-TEMPERATURE STRESS STUDIESTHIBAULT LR; PICKAR KA.1972; IN: ELECTRON ION BEAM SCI. TECHNOL. VTH INT. CONF.; PRINCETON; ELECTROCHEM. SOC.; DA. 1972; PP. 148-161; BIBL. 17 REF.Conference Proceedings

CARRIER TRANSPORT AND STORAGE EFFECTS IN AU ION IMPLANTED SIO2 STRUCTURESCHEN LI; PICKAR KA; SZE SM et al.1972; SOLID-STATE ELECTRON.; G.B.; DA. 1972; VOL. 15; NO 9; PP. 979-986; BIBL. 18 REF.Serial Issue

A DOPED SURFACE TWO-PHASE CCDKRAMBECK RH; WALDEN RH; PICKAR KA et al.1972; BELL SYST. TECH. J.; U.S.A.; DA. 1972; VOL. 51; NO 8; PP. 1849-1866; BIBL. 9 REF.Serial Issue

A DOPED SURFACE TWO-PHASE CCD.KRAMBECK RH; WALDEN RH; PICKAR KA et al.1972; BELL SYST. TECH. J.; U.S.A.; DA. 1972; VOL. 51; NO 8; PP. 1849-1866; BIBL. 9 REF.Article

A RUTHERFORD SCATTERING STUDY OF THE DIFFUSION OF HEAVY METAL IMPURITIES IN SILICON TO ION-DAMAGED SURFACE LAYERSBUCK TM; POATE JM; PICKAR KA et al.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 35; PP. 362-379; BIBL. 37 REF.; (SOLID-VAC. INTERFACE. PROC. 2ND SYMP. SURF. PHYS.; ENSCHEDE, NETH.; 1972)Conference Paper

GETTERING RATES OF VARIOUS FAST-DIFFUSING METAL IMPURITIES AT ION-DAMAGED LAYERS ON SILICONBUCK TM; PICKAR KA; POATE JM et al.1972; APPL. PHYS. LETTERS; U.S.A.; DA. 1972; VOL. 21; NO 10; PP. 485-487; BIBL. 15 REF.Serial Issue

ION-IMPLANTATION-DAMAGE GETTERING EFFECT IN SILICON PHOTODIODE ARRAY CAMERA TARGETHSIEH CM; MATHEWS JR; SEIDEH HD et al.1973; APPL. PHYS. LETTERS; U.S.A.; DA. 1973; VOL. 22; NO 5; PP. 238-240; BIBL. 9 REF.Serial Issue

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